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2000-11-30
Electron Microscopy and Analysis, Third Edition - de Peter J. Goodhew (Author)
Caractéristiques Electron Microscopy and Analysis, Third Edition
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| Le Titre Du Fichier | Electron Microscopy and Analysis, Third Edition |
| Date de Parution | 2000-11-30 |
| Traducteur | Tula Marcus |
| Quantité de Pages | 300 Pages |
| Taille du fichier | 21.28 MB |
| Langue du Livre | Anglais et Français |
| Éditeur | ThomsonReuters |
| ISBN-10 | 7676230417-UUF |
| Type de e-Book | PDF EPub AMZ DITA Mobi |
| Écrivain | Peter J. Goodhew |
| ISBN-13 | 474-5431375303-JDH |
| Nom de Fichier | Electron-Microscopy-and-Analysis-Third-Edition.pdf |
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From Electron Microscopy and Analysis textbook by Peter J Goodhew John Humphreys… The chapter gives insight into the scanning electron microscope technique
Versatile micro computedtomography instruments provide solutions for quantitative analysis for a variety of research applications
DualBeam Focused Ion BeamScanning Electron Microscope systems FIBSEMs provide for sitespecific material removal with the SEM then providing nondestructive imaging of the exposed subsurface features
From Electron Microscopy and Analysis textbook by Peter J Goodhew Jo… The chapter explains the diffraction of electrons and demonstrates what it can reveal
Découvrez et achetez Advances in Imaging and Electron Physics Livraison en Europe à 1 centime seulement
Scanning electron microscopy is a powerful tool for the observation of surfaces SEM images can be easily associated with microanalysis and elementary mapping obtained by Xray spectrometry